Optical Profiler
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Product Information
Product Description
The S wide is a dedicated system designed to rapidly measure large sample areas up to 300 x 300 mm. It provides all the benefits of a digital microscope integrated into a high resolution measuring instrument. Extremely easy-to-use with one single button acquisition.
SOLUTIONS
Large Area 3D Optical Metrology System
Advanced manufacturing
Archaeology & Paleontology
Consumer electronics
Medical devices
Molding
Optics
Watch industry
Sub-micron height repeatability over entire extended area
One shot height measurement up to 40 mm without Z scanning
Bi-telecentric lenses with very low field distortion providing accurate metrology
Form deviation from 3D CAD models
providing the geometric difference and tolerance measurement
Bi-telecentric lenses with very low field distortion providing accurate metrology
Form deviation from 3D CAD models
providing the geometric difference and tolerance measurement
Additional Information
- • Seller Company: Sensofar Metrology
- • Stock Status: In Stock
- • VAT Rate: %20
- • Delivery Status: Select address for delivery eligibility.
