Raman Microscope

The Icon AFM-Raman system brings together the complimentary techniques of atomic force microscopy and Raman microscopy to provide critical information on both the topography and the chemical composition of a sample. When these techniques are further enhanced with advanced AFM modes, such as Bruker-exclusive PeakForce TUNA™ electrical characterization and PeakForce QNM® quantitative nanomechanical mapping, researchers are able to better understand the mechanisms that lead to specific material properties.

Correlated

AFM and u-Raman data

Enables co-localized measurements with unsurpassed efficiency and ease.

Advanced

AFM modes

Help researchers better understand the mechanisms that lead to specific material properties.

Proven

Sets a new performance standard for micro-Raman research capabilities.

Configuration Stability and Flexibility

The AFM-Raman system, consisting of the Dimension Icon® AFM and a research-grade confocal Raman microscope (Horiba, LabRam), is on a single, rigid, anti-vibration platform. This configuration allows the system to maintain each individual instrument's full functionality, providing optimum combined performance. As an example, the confi guration enables the full complement of Icon upgrades, AFM modes, and ease-of-use features, including Bruker-exclusive ScanAsyst®. You are able to tailor the most effective combination of modes for your application.

Seamless Technique and Analysis Integration

Within seconds a sample can be transferred between the two techniques without disturbance. AFM and spectroscopic measurements of the same sample area are carried out consecutively without danger of misalignment or imprecise location of features.