Specular Microscope

Multi area specular microscopy
Enhanced usability and quick analysis
Advanced manual analysis functions
Combination of auto and manual analyses
Additional features with CEM Viewer for NAVIS-EX

Detailed Information

Multi area specular microscopy

In addition to conventional central and peripheral specular microscopy, the CEM-530 includes a NIDEK original function that captures paracentral images. The combination of central, paracentral, and peripheral imaging provides a broader, overall view that can be used for detailed morphological and quantitative evaluation of the endothelial layer and individual cells.

Enhanced usability and quick analysis

The 3D auto tracking and auto shot functions result in a user friendly and patient friendly experience.
Data analysis within 2 seconds allows efficient patient flow.

Advanced manual analysis functions

Center point
Select the approximate center of a cell. The cells are detected based on the surrounding points. This method is effective for areas where groups of cells are clumped together.

Corner point

Trace the outlines of the cells to be analyzed by selecting the corners of each cell. This method is suitable for detailed identification of the size and dimension of isolated cells.

Pattern select

Select a hexagonal reference pattern that is similar to the cell size and drag it onto the cell to be analyzed. This method is effective for rough identification of the size and dimension of the cells.

Combination of auto and manual analyses

All three manual analysis methods can be performed on the same image and on auto-analyzed images.