Spectrometer Measurement Device

DSR300 series micro-nano spectral response measurement system is dedicated to low-dimensional materials, providing high-precision spectral scanning and photo current scanning measurement. 40 m detection spot make the system can measure the minimum size 100 μm sample. Ultra-high stability light source provide the high accuracy; Multiple light sources can be integrated in the system to measure a variety of detectors. The friendly software is easy to use and automatically control the device to operate.

Function：

■ Spectral Responsivity

■ External Quantum Efficiency

■ Bias Voltage IT Curve

■ LBIC Mapping

■ Response Linearity Test

Main Technical Parameter

Light Source

Xenon light Source

Spectral Range: 250 - 1800 nm

Instability: ＜ 1%

Supercontinuum light source

Spectral Range: 400

- 2400 nm

Frequency: 0.01 -

200 MHz

Pulse width: 100 ps

CW laser

Optional Wavelength: 405 nm, 532 nm, 633

nm, 808 nm, 980 nm;

Instability: ＜ 1%

Pulsed laser

Optional Wavelength: 375 nm, 405 nm, 488

nm, 785 nm, 976 nm; Pulse width: 100 ps

Frequency: 1-20 MHz

Micro lens

10x objective lens (Standard )

Work distance＞17 mm

NA: 0.42

Spectral Range: 350

- 800 nm

50x objective lens

Work distance＞17 mm

NA: 0.42

Spectral Range: 480

- 1800 nm

50x UV objective lens

Work distance＞12 mm

NA: 0.42

Spectral Range: 240 - 500 nm

40x reflective objective lens

Work distance＞7.8 mm

NA: 0.5

Spectral Range: 200 nm - 20 um

Data Acquisition Unit

Lock-in Amplifier

Frequency: 20 Hz - 1 KHz Drift: ＜ 0.1°/℃ below 10 kHz Voltage or Current Input mode 1nV to 1V full-scale sensitivity Current gain 106 or 108 V/A Dynamic Reserve >100 dB Display: X、Y、R、θ