STEM Microscope

for multimodal characterization of nanoscale morphological, chemical, and structural properties of functional materials, thin films, and synthetic particles, with stand-out 4D-STEM performance and unprecedented usability.

Synchronization of Scanning with Diffraction Imaging, EDS Acquisition and Beam Blanking.
Integrated, Near Real-Time 4D-STEM data Analysis and Processing
Performance benefits from Electron Beam Precession and near-UHV
A novel approach to STEM User Experience

Analytical 4D-STEM

The full picture of electron beam - specimen interaction

4D-STEM is the microscopy method of choice for true nanoscale, multimodal characterization of material properties such as morphology, chemistry, and structure. At each pixel in the STEM dataset, TESCAN TENSOR acquires a diffraction pattern and an EDS spectrum, fast and perfectly synchronized. Together, diffraction and spectroscopy data encapsulate the full picture of electron beam - specimen interaction, from which a wide range of material properties can be derived.

Near Real-time Analysis and Processing of 4D-STEM data

A truly unique feature of TESCAN TENSOR is Explore, TENSOR’s integrated platform for real-time processing and analysis of large-scale scanning electron diffraction datasets.

Explore brings 4D-STEM measurements to Material Scientists, Semiconductor Researchers and Failure Analysis, and Crystallographers, without requiring expert knowledge of STEM optics or 4D-STEM data analysis and post-processing.

Advanced users are served with the ability to adjust the preset optimized optical properties for each STEM or 4D-STEM measurement to their preference. Furthermore,