X-Ray Diffractometer

ADX-2700 θ-θ Powder X-ray Diffraction Instrument(XRD) is multi-function X ray diffractometer with exceptional analysis speed, reliability and reproducibility. The ADX2700 XRD is a diffraction instrument designed for the challenges of modern materials research. ADX2700 X Ray Diffractometer can analyze powders, liquids, thin films, nanomaterials and many other different materials. The ADX2700 X-Ray Diffraction can be used for many different applications: Academic, Pharmaceuticals, Chemical & Petrochemical, Material Research, Thin Film Metrology, Nano technology, Food & Cosmetics, Forensics, Mining & Minerals, Metals, Plastics & Polymers, etc.The ADX2700 X-ray Diffraction(XRD) has function of both θ-θ (theta-theta) and θ-2θ (theta-2theta) X-ray Powder Diffraction.

Features

Computed tomography, High-resolution X-ray diffraction, High throughput screening, In-plane diffraction, Crystallite size and micro-strain analysis, Micro-diffraction, Non-ambient diffraction, Pair distribution function analysis, Phase identification, Phase quantification, Reflectivity analysis, Residual stress analysis, Crystallography, Texture analysis, Transmission, Thin film analysis.

ADX-DWZ Combination of Eulerian cradle for stress and texture investigations, Thin film and Quantity Analysis attachment with control and analysis software with alignment-free feature.

ADCX sample changer is compact and rugged.

Integrated spinning improves particle statistics in polycrystalline sample measurements.
Fully automatic alignment.